JEOL NeoScope™ Benchtop SEM

A variable pressure, tungsten filament SEM, with portable capabilities
JEOL Neoscope
The JEOL NeoScope™ Benchtop SEM microscope boasts the capability of being portable, so it can travel and be set up anywhere, as long as there is a power supply and stable ground. For companies or education providers where access to the lab may not be possible, this microscope and its ability to travel could present a preferable opportunity. If you would like to enquire about use of the NeoScope outside of the PEMC setting, please contact us.

Technical specification

Resolution: 6nm (@15kV)
Magnification: x24 - 200,000
Accelerating Voltage: 5 kV, 10 kV, 15 kV (3 stages)
Vacuum modes: High Vacuum, Low Vacuum and Charge compensation pressure

Equipment specification

  • JEOL 30mm2 x-ray EDS detector

Available techniques